The way hardware/software test were ran on a special measurement instrument of NXP Semiconductor needed to be automated. In the past, the to be tested software needed to compiled to a static library which the internal computer of the measurement instrument could use where test cases needed to be written in a hardware specific language.

I recommended and implemented  an OSAL (Operating System Abstraction Layer) which can be included in the developer’s code and compiled into a binary format the internal computer of the measurement instrument can understand. This means you can use regular test libraries like CUnit or Catch2 to run test cases.

The types of test ran use data in the form of complex numbers. This means in order to verify if the test ran successfully I had to research how complex numbers work, how they are used in SDR applications and how I can analyze/visualize them.

Documentation or schematics of the work I have done cannot be shown publicly. Please contact me to sign an NDA if you’re interested about the details!